- TOP
- Product
- Test solution
- Test Sockets
- probe
probe
Sockets with spring probes are available for ball grid array (BGA), land grid array (LGA), and special packages and respond to high frequency, multi-pin, and other custom specifications.
-
- Product name
- IC588 Series
- Features
-
• Full customization of sockets using spring probe pins to meet customer requirements.
• In-house production of components allowing for special shapes and special packages.
- Category 1
-
- Memory
- Micro
- Logic
- Analog
- Power device
- Sensor
- RF device
- Optical device
- Module
- Category 2
-
- BGA
- LGA
- QFN
- QFJ
-
- Product name
- IC544 Series
- Features
-
• Custom socket with 1.6-mm test length for BGAs/LGAs.
• High frequencies supported.
• 0.8-mm pitch or more.
- Category 1
-
- Memory
- Micro
- Logic
- Analog
- Power device
- Sensor
- RF device
- Optical device
- Module
- Category 2
-
- BGA
- LGA
-
- Product name
- IC434 Series
- Features
-
• Custom socket with spring probe pins
• 0.5-mm pitch; Test length: Up to 4.0 mm
- Category 1
-
- Memory
- Micro
- Logic
- Analog
- Power device
- Sensor
- RF device
- Optical device
- Module
- Category 2
-
- BGA
- LGA
- QFP
- QFN
- SOP
- SON
-
- Product name
- IC424 Series
- Features
-
• Custom socket with spring probe pins
• 0.5-mm pitch; Test length: 4.0 mm or more
- Category 1
-
- Memory
- Micro
- Logic
- Analog
- Power device
- Sensor
- Optical device
- Module
- Category 2
-
- BGA
- LGA
- QFP
- QFN
- SOP
- SON
